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STEM-EELS Experiments Yield Enhanced Chiral Data and Images

3/24/2026

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Story summary
  • The STEM-EELS experiments generate data files containing ADF images and low-loss/high-loss EELS data.
  • Energy calibration occurs using low-loss data processed through Digital Micrograph software.
  • ADF images identify Dy atomic columns, sorted into chiral+ and chiral- groups, with a 50 × 50 pixel ROI for template matching.
  • These groups are aligned and averaged to produce final ADF images, while high-loss data undergoes similar alignment to create chiral EELS datacubes with improved signal-to-noise ratios.
  • Post-processing includes background removal and normalization, resulting in processed high-loss stacks that show the Fe sublattice spectrum from 680 to 780 eV.