Story perspectives
STEM-EELS Experiments Yield Enhanced Chiral Data and Images
3/24/2026
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Story summary
- The STEM-EELS experiments generate data files containing ADF images and low-loss/high-loss EELS data.
- Energy calibration occurs using low-loss data processed through Digital Micrograph software.
- ADF images identify Dy atomic columns, sorted into chiral+ and chiral- groups, with a 50 × 50 pixel ROI for template matching.
- These groups are aligned and averaged to produce final ADF images, while high-loss data undergoes similar alignment to create chiral EELS datacubes with improved signal-to-noise ratios.
- Post-processing includes background removal and normalization, resulting in processed high-loss stacks that show the Fe sublattice spectrum from 680 to 780 eV.
